TEST_NAME : Wafer
TEST_DATE : 24_10_07-16_01_49
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-003-021-00 | FUSED_ID : 6359364768413790544
  IC_TEMP :  -76.57 | VDDM : 1112.11 | AUX_INT :   -9.13 | CsaBias :   52.30
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.47500e-03 / 2
  ADC_P0  : -9.13380e-03 ± 2.59928e-02
  ADC_P1  : 8.82631e-03 ± 6.57333e-04
  ADC_P2  : -7.22161e-06 ± 3.28928e-06
  CSA_Chi2/NDF : 1.76717e-04 / 2
  CSA_P0  : 5.55841e-02 ± 8.86668e-03
  CSA_P1  : 1.02220e-02 ± 6.68041e-04
  CSA_P2  : -5.83497e-05 ± 1.01735e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4326', '1.800', '0.1241', '1.800', '0.1039', '7.000', '0.7083', 1, 1, 1, 1, 1728309708.9764705]
VI_after__Init : ['1.201', '0.4335', '1.800', '0.1250', '1.800', '0.0961', '7.000', '0.7078', 1, 1, 1, 1, 1728309717.3147945]
VI_at__the_End : ['1.201', '0.4634', '1.800', '0.1331', '1.799', '0.1219', '7.000', '0.7081', 1, 1, 1, 1, 1728309780.8829136]