TEST_NAME : Wafer
TEST_DATE : 24_10_07-16_26_27
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-004-006-15 | FUSED_ID : 6359364768413794415
  IC_TEMP :  -78.86 | VDDM : 1101.33 | AUX_INT :   -9.18 | CsaBias :   54.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35430e-03 / 2
  ADC_P0  : -9.18128e-03 ± 2.48631e-02
  ADC_P1  : 9.18186e-03 ± 6.46743e-04
  ADC_P2  : -8.22204e-06 ± 3.32640e-06
  CSA_Chi2/NDF : 1.48813e-04 / 2
  CSA_P0  : 6.01756e-02 ± 8.13659e-03
  CSA_P1  : 1.01056e-02 ± 6.13033e-04
  CSA_P2  : -5.67417e-05 ± 9.33577e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [15, 29, 49, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [65]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4502', '1.800', '0.1331', '1.799', '0.1041', '7.000', '0.7076', 1, 1, 1, 1, 1728311187.4103925]
VI_after__Init : ['1.202', '0.4520', '1.800', '0.1333', '1.800', '0.0985', '7.000', '0.7075', 1, 1, 1, 1, 1728311195.3577754]
VI_at__the_End : ['1.201', '0.4660', '1.800', '0.1377', '1.800', '0.1233', '7.000', '0.7083', 1, 1, 1, 1, 1728311256.6989872]