TEST_NAME : Wafer
TEST_DATE : 24_10_07-16_29_45
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-004-008-15 | FUSED_ID : 6359364768413794447
  IC_TEMP :  -75.47 | VDDM : 1115.03 | AUX_INT :  -10.89 | CsaBias :   66.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.95165e-03 / 2
  ADC_P0  : -1.08895e-02 ± 2.99657e-02
  ADC_P1  : 8.60253e-03 ± 7.40591e-04
  ADC_P2  : -6.41657e-06 ± 3.64865e-06
  CSA_Chi2/NDF : 2.02543e-04 / 2
  CSA_P0  : 5.63587e-02 ± 9.49251e-03
  CSA_P1  : 9.98661e-03 ± 7.15192e-04
  CSA_P2  : -5.60657e-05 ± 1.08915e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [70, 80]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [50, 95, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1360', '1.800', '0.1377', '1.799', '0.0840', '7.000', '0.7077', 1, 1, 1, 1, 1728311384.5023081]
VI_after__Init : ['1.201', '0.1359', '1.800', '0.1375', '1.799', '0.0783', '7.000', '0.7076', 1, 1, 1, 1, 1728311393.311557]
VI_at__the_End : ['1.201', '0.4594', '1.800', '0.1362', '1.800', '0.1219', '7.000', '0.7083', 1, 1, 1, 1, 1728311452.4240372]