TEST_NAME : Wafer
TEST_DATE : 24_10_07-16_34_40
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-004-011-15 | FUSED_ID : 6359364768413794495
  IC_TEMP :  -67.04 | VDDM : 1113.86 | AUX_INT :  -57.35 | CsaBias :   24.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.44204e-03 / 2
  ADC_P0  : -5.73528e-02 ± 3.68796e-02
  ADC_P1  : 9.14531e-03 ± 9.02611e-04
  ADC_P2  : -7.69381e-06 ± 4.39260e-06
  CSA_Chi2/NDF : 2.06455e-04 / 2
  CSA_P0  : 5.82635e-02 ± 9.58374e-03
  CSA_P1  : 1.02937e-02 ± 7.22066e-04
  CSA_P2  : -5.94226e-05 ± 1.09962e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [22, 58, 76]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [11, 64, 80, 92, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3907', '1.800', '0.1478', '1.799', '0.0972', '7.000', '0.7076', 1, 1, 1, 1, 1728311680.087612]
VI_after__Init : ['1.201', '0.3911', '1.800', '0.1480', '1.800', '0.0927', '7.000', '0.7076', 1, 1, 1, 1, 1728311688.3379056]
VI_at__the_End : ['1.202', '0.4666', '1.800', '0.1386', '1.804', '0.1205', '7.000', '0.7084', 1, 1, 1, 1, 1728311756.5187242]