TEST_NAME : Wafer
TEST_DATE : 24_10_07-16_36_19
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-004-012-15 | FUSED_ID : 6359364768413794511
  IC_TEMP :  -71.57 | VDDM : 1122.88 | AUX_INT :  -10.18 | CsaBias :   66.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.84573e-03 / 2
  ADC_P0  : -1.01835e-02 ± 2.91632e-02
  ADC_P1  : 8.54754e-03 ± 7.24695e-04
  ADC_P2  : -6.02497e-06 ± 3.58744e-06
  CSA_Chi2/NDF : 1.75683e-04 / 2
  CSA_P0  : 5.66140e-02 ± 8.84071e-03
  CSA_P1  : 1.00905e-02 ± 6.66084e-04
  CSA_P2  : -5.55485e-05 ± 1.01437e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [27, 49]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2352', '1.800', '0.1149', '1.800', '0.0887', '7.000', '0.7076', 1, 1, 1, 1, 1728311778.7860284]
VI_after__Init : ['1.202', '0.2355', '1.800', '0.1149', '1.800', '0.0831', '7.000', '0.7076', 1, 1, 1, 1, 1728311787.0913827]
VI_at__the_End : ['1.201', '0.4676', '1.800', '0.1359', '1.808', '0.1205', '7.000', '0.7084', 1, 1, 1, 1, 1728311854.0892532]