TEST_NAME : Wafer
TEST_DATE : 24_10_07-16_37_57
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-004-013-15 | FUSED_ID : 6359364768413794527
  IC_TEMP :  -72.17 | VDDM : 1120.81 | AUX_INT :  -10.67 | CsaBias :   58.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.96004e-03 / 2
  ADC_P0  : -1.06738e-02 ± 3.00414e-02
  ADC_P1  : 8.75586e-03 ± 7.58205e-04
  ADC_P2  : -6.56912e-06 ± 3.81339e-06
  CSA_Chi2/NDF : 1.58210e-04 / 2
  CSA_P0  : 5.82318e-02 ± 8.38956e-03
  CSA_P1  : 1.01356e-02 ± 6.32093e-04
  CSA_P2  : -5.67753e-05 ± 9.62603e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [7, 42, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [89]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3316', '1.800', '0.1596', '1.800', '0.0902', '7.000', '0.7076', 1, 1, 1, 1, 1728311877.0995126]
VI_after__Init : ['1.201', '0.3316', '1.800', '0.1597', '1.800', '0.0852', '7.000', '0.7076', 1, 1, 1, 1, 1728311885.355848]
VI_at__the_End : ['1.201', '0.4690', '1.800', '0.1357', '1.802', '0.1191', '7.000', '0.7085', 1, 1, 1, 1, 1728311946.0800977]