TEST_NAME : Wafer
TEST_DATE : 24_10_07-16_42_52
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-004-016-08 | FUSED_ID : 6359364768413794568
  IC_TEMP :  -71.53 | VDDM : 1124.00 | AUX_INT :  -10.30 | CsaBias :   68.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.91795e-03 / 2
  ADC_P0  : -1.03034e-02 ± 2.97079e-02
  ADC_P1  : 8.77529e-03 ± 7.47366e-04
  ADC_P2  : -6.89084e-06 ± 3.73731e-06
  CSA_Chi2/NDF : 1.38299e-04 / 2
  CSA_P0  : 5.64308e-02 ± 7.84390e-03
  CSA_P1  : 9.68545e-03 ± 5.90981e-04
  CSA_P2  : -5.05151e-05 ± 8.99994e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [31, 45, 93, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [16, 85, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1704', '1.800', '0.1408', '1.800', '0.0909', '7.000', '0.7078', 1, 1, 1, 1, 1728312171.548818]
VI_after__Init : ['1.202', '0.1704', '1.800', '0.1408', '1.801', '0.0858', '7.000', '0.7080', 1, 1, 1, 1, 1728312179.799232]
VI_at__the_End : ['1.201', '0.4621', '1.800', '0.1353', '1.804', '0.1197', '7.000', '0.7083', 1, 1, 1, 1, 1728312246.3291433]