TEST_NAME : Wafer
TEST_DATE : 24_10_07-16_46_09
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-004-018-08 | FUSED_ID : 6359364768413794600
  IC_TEMP :  -63.95 | VDDM : 1115.15 | AUX_INT :  -10.30 | CsaBias :   72.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.64945e-03 / 2
  ADC_P0  : -1.02984e-02 ± 2.74719e-02
  ADC_P1  : 8.29630e-03 ± 6.42449e-04
  ADC_P2  : -6.67971e-06 ± 2.98135e-06
  CSA_Chi2/NDF : 1.03453e-04 / 2
  CSA_P0  : 5.76507e-02 ± 6.78411e-03
  CSA_P1  : 9.35865e-03 ± 5.11134e-04
  CSA_P2  : -4.44167e-05 ± 7.78397e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1703', '1.800', '0.1300', '1.799', '0.0836', '7.000', '0.7076', 1, 1, 1, 1, 1728312368.806793]
VI_after__Init : ['1.201', '0.1704', '1.800', '0.1300', '1.800', '0.0780', '7.000', '0.7079', 1, 1, 1, 1, 1728312377.0351865]
VI_at__the_End : ['1.202', '0.4674', '1.800', '0.1323', '1.802', '0.1178', '7.000', '0.7085', 1, 1, 1, 1, 1728312447.599741]