TEST_NAME : Wafer
TEST_DATE : 24_10_07-16_47_48
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-004-019-08 | FUSED_ID : 6359364768413794616
  IC_TEMP :  -73.91 | VDDM : 1116.14 | AUX_INT :   -9.41 | CsaBias :   51.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45958e-03 / 2
  ADC_P0  : -9.41095e-03 ± 2.58650e-02
  ADC_P1  : 8.81898e-03 ± 6.56224e-04
  ADC_P2  : -6.96301e-06 ± 3.30265e-06
  CSA_Chi2/NDF : 1.91272e-04 / 2
  CSA_P0  : 5.79503e-02 ± 9.22460e-03
  CSA_P1  : 1.03457e-02 ± 6.95007e-04
  CSA_P2  : -5.98849e-05 ± 1.05841e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [85]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [51, 85, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3989', '1.800', '0.1802', '1.799', '0.0988', '7.000', '0.7080', 1, 1, 1, 1, 1728312467.6042192]
VI_after__Init : ['1.202', '0.3997', '1.800', '0.1809', '1.799', '0.0932', '7.000', '0.7078', 1, 1, 1, 1, 1728312476.2986116]
VI_at__the_End : ['1.201', '0.4672', '1.800', '0.1371', '1.805', '0.1194', '7.000', '0.7084', 1, 1, 1, 1, 1728312541.0966506]