TEST_NAME : Wafer
TEST_DATE : 24_10_07-16_49_26
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-004-020-08 | FUSED_ID : 6359364768413794632
  IC_TEMP :  -64.50 | VDDM : 1111.50 | AUX_INT :  -11.87 | CsaBias :   65.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.29816e-03 / 2
  ADC_P0  : -1.18722e-02 ± 3.25517e-02
  ADC_P1  : 8.67126e-03 ± 8.09943e-04
  ADC_P2  : -6.37160e-06 ± 4.03204e-06
  CSA_Chi2/NDF : 1.55860e-04 / 2
  CSA_P0  : 5.70188e-02 ± 8.32701e-03
  CSA_P1  : 9.90867e-03 ± 6.27380e-04
  CSA_P2  : -5.15917e-05 ± 9.55426e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [45]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [25, 71, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3814', '1.800', '0.1629', '1.799', '0.0916', '7.000', '0.7078', 1, 1, 1, 1, 1728312566.7146463]
VI_after__Init : ['1.202', '0.3821', '1.800', '0.1632', '1.800', '0.0861', '7.000', '0.7078', 1, 1, 1, 1, 1728312574.6580348]
VI_at__the_End : ['1.201', '0.4711', '1.800', '0.1356', '1.801', '0.1184', '7.000', '0.7086', 1, 1, 1, 1, 1728312635.318415]