TEST_NAME : Wafer
TEST_DATE : 24_10_07-16_51_05
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-004-021-08 | FUSED_ID : 6359364768413794648
  IC_TEMP :  -77.15 | VDDM : 1133.18 | AUX_INT : -189.76 | CsaBias :  -97.84
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30949e-03 / 2
  ADC_P0  : -1.89764e-01 ± 3.38940e-02
  ADC_P1  : 1.16264e-02 ± 8.07308e-04
  ADC_P2  : -1.69394e-05 ± 3.79287e-06
  CSA_Chi2/NDF : 1.88285e-04 / 2
  CSA_P0  : 5.85691e-02 ± 9.15229e-03
  CSA_P1  : 1.05153e-02 ± 6.89559e-04
  CSA_P2  : -6.28192e-05 ± 1.05012e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [59]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [66]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3711', '1.800', '0.1602', '1.800', '0.0943', '7.000', '0.7079', 1, 1, 1, 1, 1728312664.5341616]
VI_after__Init : ['1.202', '0.3722', '1.800', '0.1607', '1.799', '0.0889', '7.000', '0.7079', 1, 1, 1, 1, 1728312673.3094873]
VI_at__the_End : ['1.201', '0.4693', '1.800', '0.1378', '1.804', '0.1218', '7.000', '0.7087', 1, 1, 1, 1, 1728312739.4324765]