TEST_NAME : Wafer
TEST_DATE : 24_10_07-16_54_22
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-004-023-08 | FUSED_ID : 6359364768413794680
  IC_TEMP :  -70.93 | VDDM : 1119.57 | AUX_INT :   -9.46 | CsaBias :   69.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43801e-03 / 2
  ADC_P0  : -9.46295e-03 ± 2.56814e-02
  ADC_P1  : 8.80029e-03 ± 6.53714e-04
  ADC_P2  : -6.66502e-06 ± 3.30909e-06
  CSA_Chi2/NDF : 2.39495e-04 / 2
  CSA_P0  : 5.67473e-02 ± 1.03222e-02
  CSA_P1  : 1.07323e-02 ± 7.77701e-04
  CSA_P2  : -6.41158e-05 ± 1.18435e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [13, 76]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3277', '1.800', '0.1633', '1.799', '0.0950', '7.000', '0.7081', 1, 1, 1, 1, 1728312862.1659944]
VI_after__Init : ['1.201', '0.3279', '1.800', '0.1634', '1.801', '0.0894', '7.000', '0.7078', 1, 1, 1, 1, 1728312870.3204515]
VI_at__the_End : ['1.201', '0.4756', '1.800', '0.1356', '1.804', '0.1209', '7.000', '0.7085', 1, 1, 1, 1, 1728312932.505683]