TEST_NAME : Wafer
TEST_DATE : 24_10_07-17_30_31
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-005-004-02 | FUSED_ID : 6359364768413798466
  IC_TEMP :  -79.36 | VDDM : 1117.64 | AUX_INT :   -7.96 | CsaBias :   56.51
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25757e-03 / 2
  ADC_P0  : -7.95794e-03 ± 2.40071e-02
  ADC_P1  : 9.26250e-03 ± 6.45928e-04
  ADC_P2  : -7.63858e-06 ± 3.42925e-06
  CSA_Chi2/NDF : 2.01029e-04 / 2
  CSA_P0  : 5.64174e-02 ± 9.45696e-03
  CSA_P1  : 1.02722e-02 ± 7.12514e-04
  CSA_P2  : -5.85425e-05 ± 1.08507e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [10, 62]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3780', '1.800', '0.1573', '1.799', '0.0956', '7.000', '0.7081', 1, 1, 1, 1, 1728315030.7588236]
VI_after__Init : ['1.202', '0.3781', '1.800', '0.1577', '1.801', '0.0901', '7.000', '0.7080', 1, 1, 1, 1, 1728315039.0622854]
VI_at__the_End : ['1.201', '0.4645', '1.800', '0.1391', '1.805', '0.1203', '7.000', '0.7090', 1, 1, 1, 1, 1728315100.8375053]