TEST_NAME : Wafer
TEST_DATE : 24_10_07-17_27_14
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-005-006-02 | FUSED_ID : 6359364768413798498
  IC_TEMP :  -67.31 | VDDM : 1112.13 | AUX_INT :  -10.79 | CsaBias :   74.42
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.62125e-03 / 2
  ADC_P0  : -1.07920e-02 ± 2.72088e-02
  ADC_P1  : 8.59255e-03 ± 6.57006e-04
  ADC_P2  : -7.08841e-06 ± 3.16152e-06
  CSA_Chi2/NDF : 1.62277e-04 / 2
  CSA_P0  : 5.73342e-02 ± 8.49671e-03
  CSA_P1  : 9.60733e-03 ± 6.40166e-04
  CSA_P2  : -4.68736e-05 ± 9.74897e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [3, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [12, 60, 96]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.4099', '1.800', '0.1606', '1.799', '0.0996', '7.000', '0.7090', 1, 1, 1, 1, 1728314833.548991]
VI_after__Init : ['1.202', '0.4102', '1.800', '0.1607', '1.800', '0.0920', '7.000', '0.7082', 1, 1, 1, 1, 1728314842.5323277]
VI_at__the_End : ['1.202', '0.4719', '1.800', '0.1364', '1.802', '0.1174', '7.000', '0.7090', 1, 1, 1, 1, 1728314906.3023934]