TEST_NAME : Wafer
TEST_DATE : 24_10_07-17_25_35
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-005-007-02 | FUSED_ID : 6359364768413798514
  IC_TEMP :  -73.24 | VDDM : 1111.14 | AUX_INT :   -9.83 | CsaBias :   60.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.55411e-03 / 2
  ADC_P0  : -9.82746e-03 ± 2.66597e-02
  ADC_P1  : 8.88042e-03 ± 6.70485e-04
  ADC_P2  : -7.61074e-06 ± 3.33893e-06
  CSA_Chi2/NDF : 1.91024e-04 / 2
  CSA_P0  : 5.71035e-02 ± 9.21863e-03
  CSA_P1  : 1.02313e-02 ± 6.94558e-04
  CSA_P2  : -5.76459e-05 ± 1.05773e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [59, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2388', '1.800', '0.1471', '1.800', '0.0859', '7.000', '0.7082', 1, 1, 1, 1, 1728314735.757467]
VI_after__Init : ['1.202', '0.2389', '1.800', '0.1471', '1.800', '0.0806', '7.000', '0.7081', 1, 1, 1, 1, 1728314743.7948904]
VI_at__the_End : ['1.202', '0.4689', '1.800', '0.1350', '1.802', '0.1184', '7.000', '0.7089', 1, 1, 1, 1, 1728314808.6509154]