TEST_NAME : Wafer
TEST_DATE : 24_10_07-17_22_18
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-005-009-02 | FUSED_ID : 6359364768413798546
  IC_TEMP :  -74.27 | VDDM : 1120.53 | AUX_INT :   -9.70 | CsaBias :   67.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45031e-03 / 2
  ADC_P0  : -9.69777e-03 ± 2.57820e-02
  ADC_P1  : 8.64543e-03 ± 6.42528e-04
  ADC_P2  : -6.50901e-06 ± 3.18556e-06
  CSA_Chi2/NDF : 2.05776e-04 / 2
  CSA_P0  : 5.74454e-02 ± 9.56797e-03
  CSA_P1  : 1.01792e-02 ± 7.20878e-04
  CSA_P2  : -5.77810e-05 ± 1.09781e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [37, 81]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [3]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1965', '1.800', '0.1545', '1.799', '0.0908', '7.000', '0.7087', 1, 1, 1, 1, 1728314538.118586]
VI_after__Init : ['1.202', '0.1965', '1.800', '0.1544', '1.800', '0.0835', '7.000', '0.7082', 1, 1, 1, 1, 1728314546.2680168]
VI_at__the_End : ['1.202', '0.4645', '1.800', '0.1369', '1.804', '0.1198', '7.000', '0.7088', 1, 1, 1, 1, 1728314610.4841125]