TEST_NAME : Wafer
TEST_DATE : 24_10_07-17_20_39
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-005-010-02 | FUSED_ID : 6359364768413798562
  IC_TEMP :  -68.51 | VDDM : 1111.81 | AUX_INT :   -7.82 | CsaBias :   67.21
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.14881e-03 / 2
  ADC_P0  : -7.82268e-03 ± 2.29171e-02
  ADC_P1  : 8.39589e-03 ± 5.55243e-04
  ADC_P2  : -6.49749e-06 ± 2.65326e-06
  CSA_Chi2/NDF : 1.47641e-04 / 2
  CSA_P0  : 5.70888e-02 ± 8.10449e-03
  CSA_P1  : 9.69960e-03 ± 6.10615e-04
  CSA_P2  : -4.92360e-05 ± 9.29894e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [32, 59, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [51]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1632', '1.800', '0.1582', '1.799', '0.0847', '7.000', '0.7089', 1, 1, 1, 1, 1728314439.0971742]
VI_after__Init : ['1.202', '0.1632', '1.800', '0.1582', '1.800', '0.0774', '7.000', '0.7079', 1, 1, 1, 1, 1728314447.814524]
VI_at__the_End : ['1.201', '0.4704', '1.800', '0.1354', '1.804', '0.1152', '7.000', '0.7087', 1, 1, 1, 1, 1728314507.5979123]