TEST_NAME : Wafer
TEST_DATE : 24_10_07-17_19_01
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-005-011-02 | FUSED_ID : 6359364768413798578
  IC_TEMP :  -62.28 | VDDM : 1117.61 | AUX_INT :  -65.95 | CsaBias :   34.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.74246e-03 / 2
  ADC_P0  : -6.59520e-02 ± 3.15486e-02
  ADC_P1  : 9.26515e-03 ± 7.55201e-04
  ADC_P2  : -8.87118e-06 ± 3.57365e-06
  CSA_Chi2/NDF : 1.76898e-04 / 2
  CSA_P0  : 5.77316e-02 ± 8.87123e-03
  CSA_P1  : 9.98806e-03 ± 6.68383e-04
  CSA_P2  : -5.10736e-05 ± 1.01787e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [14, 46]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [4, 70, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3105', '1.800', '0.1533', '1.799', '0.0971', '7.000', '0.7079', 1, 1, 1, 1, 1728314340.8297248]
VI_after__Init : ['1.201', '0.3106', '1.800', '0.1533', '1.801', '0.0917', '7.000', '0.7080', 1, 1, 1, 1, 1728314348.9280314]
VI_at__the_End : ['1.202', '0.4807', '1.800', '0.1403', '1.804', '0.1166', '7.000', '0.7086', 1, 1, 1, 1, 1728314411.2643921]