TEST_NAME : Wafer
TEST_DATE : 24_10_07-17_14_05
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-005-014-02 | FUSED_ID : 6359364768413798626
  IC_TEMP :  -73.36 | VDDM : 1122.76 | AUX_INT :  -10.73 | CsaBias :   58.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.02272e-03 / 2
  ADC_P0  : -1.07309e-02 ± 3.04553e-02
  ADC_P1  : 8.68856e-03 ± 7.41745e-04
  ADC_P2  : -7.54645e-06 ± 3.57678e-06
  CSA_Chi2/NDF : 1.69097e-04 / 2
  CSA_P0  : 5.67399e-02 ± 8.67342e-03
  CSA_P1  : 9.79949e-03 ± 6.53480e-04
  CSA_P2  : -5.38089e-05 ± 9.95173e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [41]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1450', '1.800', '0.1505', '1.800', '0.0847', '7.000', '0.7079', 1, 1, 1, 1, 1728314045.1833727]
VI_after__Init : ['1.201', '0.1450', '1.800', '0.1505', '1.800', '0.0793', '7.000', '0.7084', 1, 1, 1, 1, 1728314053.8996255]
VI_at__the_End : ['1.202', '0.4588', '1.800', '0.1340', '1.803', '0.1204', '7.000', '0.7090', 1, 1, 1, 1, 1728314108.8455508]