TEST_NAME : Wafer
TEST_DATE : 24_10_07-17_12_26
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-005-015-02 | FUSED_ID : 6359364768413798642
  IC_TEMP :  -73.76 | VDDM : 1110.70 | AUX_INT :   -8.81 | CsaBias :   69.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.38421e-03 / 2
  ADC_P0  : -8.81499e-03 ± 2.52081e-02
  ADC_P1  : 8.76817e-03 ± 6.43141e-04
  ADC_P2  : -6.56933e-06 ± 3.25256e-06
  CSA_Chi2/NDF : 1.78816e-04 / 2
  CSA_P0  : 5.86240e-02 ± 8.91918e-03
  CSA_P1  : 1.01086e-02 ± 6.71996e-04
  CSA_P2  : -5.76981e-05 ± 1.02337e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [67]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3041', '1.800', '0.1488', '1.799', '0.0964', '7.000', '0.7090', 1, 1, 1, 1, 1728313946.2060294]
VI_after__Init : ['1.201', '0.3047', '1.800', '0.1489', '1.800', '0.0894', '7.000', '0.7081', 1, 1, 1, 1, 1728313954.3033714]
VI_at__the_End : ['1.201', '0.4619', '1.800', '0.1360', '1.807', '0.1210', '7.000', '0.7087', 1, 1, 1, 1, 1728314016.6876464]