TEST_NAME : Wafer
TEST_DATE : 24_10_07-17_09_09
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-005-017-05 | FUSED_ID : 6359364768413798677
  IC_TEMP :  -71.09 | VDDM : 1121.63 | AUX_INT :   -8.75 | CsaBias :   52.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30478e-03 / 2
  ADC_P0  : -8.75154e-03 ± 2.44820e-02
  ADC_P1  : 8.75928e-03 ± 6.26711e-04
  ADC_P2  : -6.31514e-06 ± 3.18799e-06
  CSA_Chi2/NDF : 1.82072e-04 / 2
  CSA_P0  : 5.88218e-02 ± 9.00002e-03
  CSA_P1  : 1.02778e-02 ± 6.78086e-04
  CSA_P2  : -5.99328e-05 ± 1.03265e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [78]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1967', '1.800', '0.1666', '1.800', '0.0882', '7.000', '0.7078', 1, 1, 1, 1, 1728313748.6032212]
VI_after__Init : ['1.202', '0.1969', '1.800', '0.1667', '1.800', '0.0830', '7.000', '0.7080', 1, 1, 1, 1, 1728313757.3614936]
VI_at__the_End : ['1.202', '0.4648', '1.800', '0.1385', '1.804', '0.1212', '7.000', '0.7089', 1, 1, 1, 1, 1728313818.9008136]