TEST_NAME : Wafer
TEST_DATE : 24_10_07-17_04_14
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-005-020-05 | FUSED_ID : 6359364768413798725
  IC_TEMP :  -71.73 | VDDM : 1114.68 | AUX_INT :  -10.78 | CsaBias :   66.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.93768e-03 / 2
  ADC_P0  : -1.07775e-02 ± 2.98583e-02
  ADC_P1  : 8.59720e-03 ± 7.37936e-04
  ADC_P2  : -6.40155e-06 ± 3.63557e-06
  CSA_Chi2/NDF : 1.66410e-04 / 2
  CSA_P0  : 5.63940e-02 ± 8.60424e-03
  CSA_P1  : 9.94958e-03 ± 6.48267e-04
  CSA_P2  : -5.49520e-05 ± 9.87235e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [39]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [69, 93]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2316', '1.800', '0.1474', '1.800', '0.0899', '7.000', '0.7080', 1, 1, 1, 1, 1728313454.5517502]
VI_after__Init : ['1.202', '0.2317', '1.800', '0.1477', '1.800', '0.0846', '7.000', '0.7081', 1, 1, 1, 1, 1728313462.7241683]
VI_at__the_End : ['1.201', '0.4611', '1.800', '0.1345', '1.810', '0.1195', '7.000', '0.7086', 1, 1, 1, 1, 1728313528.0580003]