TEST_NAME : Wafer
TEST_DATE : 24_10_07-17_00_57
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-005-022-05 | FUSED_ID : 6359364768413798757
  IC_TEMP :  -71.36 | VDDM : 1113.49 | AUX_INT :   -9.61 | CsaBias :   60.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34683e-03 / 2
  ADC_P0  : -9.61495e-03 ± 2.47871e-02
  ADC_P1  : 8.82777e-03 ± 6.19692e-04
  ADC_P2  : -7.46377e-06 ± 3.07403e-06
  CSA_Chi2/NDF : 1.61535e-04 / 2
  CSA_P0  : 5.88761e-02 ± 8.47725e-03
  CSA_P1  : 9.92539e-03 ± 6.38700e-04
  CSA_P2  : -5.18758e-05 ± 9.72664e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [13, 18]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [9, 44, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4521', '1.800', '0.1297', '1.800', '0.1030', '7.000', '0.7080', 1, 1, 1, 1, 1728313257.2167413]
VI_after__Init : ['1.202', '0.4490', '1.800', '0.1297', '1.800', '0.0972', '7.000', '0.7080', 1, 1, 1, 1, 1728313265.4541674]
VI_at__the_End : ['1.201', '0.4739', '1.800', '0.1370', '1.803', '0.1192', '7.000', '0.7088', 1, 1, 1, 1, 1728313329.5233037]