TEST_NAME : Wafer
TEST_DATE : 24_10_07-16_59_18
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-005-023-05 | FUSED_ID : 6359364768413798773
  IC_TEMP :  -71.81 | VDDM : 1118.10 | AUX_INT :   -9.79 | CsaBias :   74.86
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.63684e-03 / 2
  ADC_P0  : -9.79369e-03 ± 2.74135e-02
  ADC_P1  : 8.52933e-03 ± 6.73003e-04
  ADC_P2  : -6.44000e-06 ± 3.28174e-06
  CSA_Chi2/NDF : 1.92516e-04 / 2
  CSA_P0  : 5.67147e-02 ± 9.25455e-03
  CSA_P1  : 1.00141e-02 ± 6.97263e-04
  CSA_P2  : -5.34769e-05 ± 1.06185e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [0]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3040', '1.800', '0.1271', '1.799', '0.0957', '7.000', '0.7087', 1, 1, 1, 1, 1728313158.292407]
VI_after__Init : ['1.201', '0.3044', '1.800', '0.1272', '1.799', '0.0887', '7.000', '0.7080', 1, 1, 1, 1, 1728313166.3778293]
VI_at__the_End : ['1.201', '0.4707', '1.800', '0.1347', '1.805', '0.1196', '7.000', '0.7087', 1, 1, 1, 1, 1728313230.5998464]