TEST_NAME : Wafer
TEST_DATE : 24_10_07-16_57_39
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-005-024-05 | FUSED_ID : 6359364768413798789
  IC_TEMP :  -68.77 | VDDM : 1117.81 | AUX_INT :   -9.79 | CsaBias :   59.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.66481e-03 / 2
  ADC_P0  : -9.79059e-03 ± 2.76568e-02
  ADC_P1  : 8.69127e-03 ± 6.93270e-04
  ADC_P2  : -6.63007e-06 ± 3.45035e-06
  CSA_Chi2/NDF : 1.60196e-04 / 2
  CSA_P0  : 5.83248e-02 ± 8.44205e-03
  CSA_P1  : 9.80485e-03 ± 6.36048e-04
  CSA_P2  : -5.00589e-05 ± 9.68625e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [10, 124, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3504', '1.800', '0.1547', '1.800', '0.0981', '7.000', '0.7080', 1, 1, 1, 1, 1728313059.1239884]
VI_after__Init : ['1.201', '0.3505', '1.800', '0.1548', '1.800', '0.0925', '7.000', '0.7079', 1, 1, 1, 1, 1728313067.1793802]
VI_at__the_End : ['1.202', '0.4721', '1.800', '0.1363', '1.801', '0.1197', '7.000', '0.7087', 1, 1, 1, 1, 1728313128.3327208]