TEST_NAME : Wafer
TEST_DATE : 24_10_07-16_56_01
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-005-025-05 | FUSED_ID : 6359364768413798805
  IC_TEMP :  -73.99 | VDDM : 1110.98 | AUX_INT :   -8.93 | CsaBias :   69.64
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.27418e-03 / 2
  ADC_P0  : -8.93395e-03 ± 2.41205e-02
  ADC_P1  : 8.79717e-03 ± 6.04452e-04
  ADC_P2  : -7.40416e-06 ± 2.99595e-06
  CSA_Chi2/NDF : 2.15115e-04 / 2
  CSA_P0  : 5.76891e-02 ± 9.78268e-03
  CSA_P1  : 1.03141e-02 ± 7.37055e-04
  CSA_P2  : -5.63994e-05 ± 1.12245e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2214', '1.800', '0.1279', '1.799', '0.0872', '7.000', '0.7081', 1, 1, 1, 1, 1728312960.9304922]
VI_after__Init : ['1.201', '0.2213', '1.800', '0.1279', '1.802', '0.0818', '7.000', '0.7079', 1, 1, 1, 1, 1728312968.9999175]
VI_at__the_End : ['1.201', '0.4775', '1.800', '0.1359', '1.804', '0.1197', '7.000', '0.7085', 1, 1, 1, 1, 1728313034.3069382]