TEST_NAME : Wafer
TEST_DATE : 24_10_07-17_35_27
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-006-005-12 | FUSED_ID : 6359364768413802588
  IC_TEMP :  -66.58 | VDDM : 1117.40 | AUX_INT :   -9.23 | CsaBias :   58.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.80699e-03 / 2
  ADC_P0  : -9.22799e-03 ± 2.88600e-02
  ADC_P1  : 8.53956e-03 ± 7.16407e-04
  ADC_P2  : -6.26480e-06 ± 3.52299e-06
  CSA_Chi2/NDF : 1.63063e-04 / 2
  CSA_P0  : 5.71224e-02 ± 8.51725e-03
  CSA_P1  : 1.01875e-02 ± 6.41713e-04
  CSA_P2  : -5.41800e-05 ± 9.77253e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [5, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3400', '1.800', '0.1784', '1.800', '0.0968', '7.000', '0.7090', 1, 1, 1, 1, 1728315327.0901678]
VI_after__Init : ['1.202', '0.3398', '1.800', '0.1785', '1.802', '0.0894', '7.000', '0.7081', 1, 1, 1, 1, 1728315335.2835302]
VI_at__the_End : ['1.201', '0.4805', '1.800', '0.1390', '1.808', '0.1158', '7.000', '0.7090', 1, 1, 1, 1, 1728315396.1148748]