TEST_NAME : Wafer
TEST_DATE : 24_10_07-17_37_06
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-006-006-12 | FUSED_ID : 6359364768413802604
  IC_TEMP :  -60.86 | VDDM : 1112.58 | AUX_INT :  -47.29 | CsaBias :   42.78
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.96707e-03 / 2
  ADC_P0  : -4.72900e-02 ± 3.22914e-02
  ADC_P1  : 9.09155e-03 ± 7.79019e-04
  ADC_P2  : -8.47709e-06 ± 3.71516e-06
  CSA_Chi2/NDF : 1.42810e-04 / 2
  CSA_P0  : 5.67630e-02 ± 7.97080e-03
  CSA_P1  : 9.59873e-03 ± 6.00542e-04
  CSA_P2  : -4.54275e-05 ± 9.14555e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [55]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [23, 39, 43]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2698', '1.800', '0.1509', '1.800', '0.0880', '7.000', '0.7082', 1, 1, 1, 1, 1728315425.7745457]
VI_after__Init : ['1.202', '0.2703', '1.800', '0.1509', '1.802', '0.0826', '7.000', '0.7081', 1, 1, 1, 1, 1728315434.0029821]
VI_at__the_End : ['1.201', '0.4765', '1.800', '0.1374', '1.804', '0.1149', '7.000', '0.7090', 1, 1, 1, 1, 1728315494.5713055]