TEST_NAME : Wafer
TEST_DATE : 24_10_07-17_40_23
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-006-008-12 | FUSED_ID : 6359364768413802636
  IC_TEMP :  -62.47 | VDDM : 1123.06 | AUX_INT :   -7.38 | CsaBias :   68.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08507e-03 / 2
  ADC_P0  : -7.37710e-03 ± 2.23037e-02
  ADC_P1  : 8.49322e-03 ± 5.56381e-04
  ADC_P2  : -6.08294e-06 ± 2.74046e-06
  CSA_Chi2/NDF : 1.52685e-04 / 2
  CSA_P0  : 5.80951e-02 ± 8.24176e-03
  CSA_P1  : 9.78704e-03 ± 6.20957e-04
  CSA_P2  : -4.84860e-05 ± 9.45645e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [13]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2269', '1.800', '0.1560', '1.800', '0.0861', '7.000', '0.7083', 1, 1, 1, 1, 1728315622.5795083]
VI_after__Init : ['1.202', '0.2271', '1.800', '0.1559', '1.800', '0.0803', '7.000', '0.7080', 1, 1, 1, 1, 1728315631.3097904]
VI_at__the_End : ['1.202', '0.4808', '1.800', '0.1377', '1.801', '0.1140', '7.000', '0.7088', 1, 1, 1, 1, 1728315693.7899914]