TEST_NAME : Wafer
TEST_DATE : 24_10_07-17_42_01
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-006-009-12 | FUSED_ID : 6359364768413802652
  IC_TEMP :  -80.22 | VDDM : 1121.33 | AUX_INT :  -11.82 | CsaBias :   88.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.07610e-03 / 2
  ADC_P0  : -1.18228e-02 ± 3.08914e-02
  ADC_P1  : 8.47063e-03 ± 7.48581e-04
  ADC_P2  : -6.10872e-06 ± 3.63713e-06
  CSA_Chi2/NDF : 1.91995e-04 / 2
  CSA_P0  : 5.71597e-02 ± 9.24203e-03
  CSA_P1  : 1.03664e-02 ± 6.96320e-04
  CSA_P2  : -6.28169e-05 ± 1.06041e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [22, 47]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [23, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2600', '1.800', '0.1134', '1.799', '0.0947', '7.000', '0.7083', 1, 1, 1, 1, 1728315720.8619354]
VI_after__Init : ['1.202', '0.2601', '1.800', '0.1135', '1.802', '0.0893', '7.000', '0.7081', 1, 1, 1, 1, 1728315729.073404]
VI_at__the_End : ['1.202', '0.4563', '1.800', '0.1384', '1.801', '0.1222', '7.000', '0.7088', 1, 1, 1, 1, 1728315790.3406549]