TEST_NAME : Wafer
TEST_DATE : 24_10_07-17_45_18
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-006-011-12 | FUSED_ID : 6359364768413802684
  IC_TEMP :  -70.35 | VDDM : 1119.59 | AUX_INT :   -8.38 | CsaBias :   61.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.20244e-03 / 2
  ADC_P0  : -8.37941e-03 ± 2.34502e-02
  ADC_P1  : 8.74670e-03 ± 5.90908e-04
  ADC_P2  : -6.99234e-06 ± 2.94289e-06
  CSA_Chi2/NDF : 1.43091e-04 / 2
  CSA_P0  : 5.84318e-02 ± 7.97865e-03
  CSA_P1  : 9.74863e-03 ± 6.01133e-04
  CSA_P2  : -5.07733e-05 ± 9.15455e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [56, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [10, 107, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1144', '1.800', '0.1484', '1.799', '0.0883', '7.000', '0.7078', 1, 1, 1, 1, 1728315918.036857]
VI_after__Init : ['1.202', '0.1144', '1.800', '0.1483', '1.800', '0.0831', '7.000', '0.7080', 1, 1, 1, 1, 1728315926.16719]
VI_at__the_End : ['1.202', '0.4654', '1.800', '0.1365', '1.805', '0.1201', '7.000', '0.7086', 1, 1, 1, 1, 1728315986.0766346]