TEST_NAME : Wafer
TEST_DATE : 24_10_07-17_48_34
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-006-013-12 | FUSED_ID : 6359364768413802716
  IC_TEMP :  -65.79 | VDDM : 1115.02 | AUX_INT :   -8.77 | CsaBias :   65.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18672e-03 / 2
  ADC_P0  : -8.76885e-03 ± 2.32746e-02
  ADC_P1  : 8.28616e-03 ± 5.51458e-04
  ADC_P2  : -6.42080e-06 ± 2.58615e-06
  CSA_Chi2/NDF : 1.48398e-04 / 2
  CSA_P0  : 5.53177e-02 ± 8.12525e-03
  CSA_P1  : 9.75681e-03 ± 6.12179e-04
  CSA_P2  : -4.94402e-05 ± 9.32276e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [52, 99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2927', '1.800', '0.1625', '1.799', '0.0888', '7.000', '0.7078', 1, 1, 1, 1, 1728316114.2557876]
VI_after__Init : ['1.202', '0.2928', '1.800', '0.1625', '1.799', '0.0838', '7.000', '0.7079', 1, 1, 1, 1, 1728316122.9780734]
VI_at__the_End : ['1.201', '0.4702', '1.800', '0.1346', '1.807', '0.1158', '7.000', '0.7083', 1, 1, 1, 1, 1728316185.3223581]