TEST_NAME : Wafer
TEST_DATE : 24_10_07-17_50_13
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-006-014-12 | FUSED_ID : 6359364768413802732
  IC_TEMP :  -70.09 | VDDM : 1115.90 | AUX_INT :   -9.22 | CsaBias :   66.27
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35287e-03 / 2
  ADC_P0  : -9.22262e-03 ± 2.49113e-02
  ADC_P1  : 8.44208e-03 ± 6.11407e-04
  ADC_P2  : -5.97942e-06 ± 2.98423e-06
  CSA_Chi2/NDF : 1.77152e-04 / 2
  CSA_P0  : 5.83879e-02 ± 8.87760e-03
  CSA_P1  : 1.01770e-02 ± 6.68863e-04
  CSA_P2  : -5.78677e-05 ± 1.01860e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [18]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2785', '1.800', '0.1364', '1.800', '0.1000', '7.000', '0.7085', 1, 1, 1, 1, 1728316213.1151898]
VI_after__Init : ['1.202', '0.2788', '1.800', '0.1365', '1.800', '0.0928', '7.000', '0.7078', 1, 1, 1, 1, 1728316221.984562]
VI_at__the_End : ['1.201', '0.4654', '1.800', '0.1343', '1.799', '0.1223', '7.000', '0.7084', 1, 1, 1, 1, 1728316282.2419102]