TEST_NAME : Wafer
TEST_DATE : 24_10_07-17_51_52
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-006-015-12 | FUSED_ID : 6359364768413802748
  IC_TEMP :  -69.33 | VDDM : 1120.49 | AUX_INT :   -8.56 | CsaBias :   69.91
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.24196e-03 / 2
  ADC_P0  : -8.56325e-03 ± 2.38059e-02
  ADC_P1  : 8.78736e-03 ± 5.94684e-04
  ADC_P2  : -7.52879e-06 ± 2.93095e-06
  CSA_Chi2/NDF : 1.54271e-04 / 2
  CSA_P0  : 5.90563e-02 ± 8.28448e-03
  CSA_P1  : 9.95993e-03 ± 6.24176e-04
  CSA_P2  : -5.29737e-05 ± 9.50546e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [42, 74, 86]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [45]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1648', '1.800', '0.1803', '1.799', '0.0936', '7.000', '0.7076', 1, 1, 1, 1, 1728316312.1126943]
VI_after__Init : ['1.202', '0.1648', '1.800', '0.1794', '1.800', '0.0883', '7.000', '0.7078', 1, 1, 1, 1, 1728316320.149033]
VI_at__the_End : ['1.201', '0.4739', '1.800', '0.1385', '1.799', '0.1205', '7.000', '0.7082', 1, 1, 1, 1, 1728316382.574336]