TEST_NAME : Wafer
TEST_DATE : 24_10_07-17_55_08
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-006-017-11 | FUSED_ID : 6359364768413802779
  IC_TEMP :  -62.27 | VDDM : 1117.13 | AUX_INT :   -9.54 | CsaBias :   66.40
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43142e-03 / 2
  ADC_P0  : -9.53798e-03 ± 2.55969e-02
  ADC_P1  : 8.49684e-03 ± 6.22864e-04
  ADC_P2  : -6.57137e-06 ± 3.00909e-06
  CSA_Chi2/NDF : 1.20894e-04 / 2
  CSA_P0  : 5.79497e-02 ± 7.33371e-03
  CSA_P1  : 9.61225e-03 ± 5.52542e-04
  CSA_P2  : -4.68550e-05 ± 8.41457e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [80]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3784', '1.800', '0.1571', '1.799', '0.0950', '7.000', '0.7081', 1, 1, 1, 1, 1728316507.8357222]
VI_after__Init : ['1.201', '0.3787', '1.800', '0.1575', '1.800', '0.0887', '7.000', '0.7076', 1, 1, 1, 1, 1728316515.9041486]
VI_at__the_End : ['1.201', '0.4736', '1.800', '0.1350', '1.806', '0.1149', '7.000', '0.7081', 1, 1, 1, 1, 1728316579.6683388]