TEST_NAME : Wafer
TEST_DATE : 24_10_07-17_56_46
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-006-018-11 | FUSED_ID : 6359364768413802795
  IC_TEMP :  -70.67 | VDDM : 1119.22 | AUX_INT :   -9.36 | CsaBias :   60.52
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39940e-03 / 2
  ADC_P0  : -9.35783e-03 ± 2.53342e-02
  ADC_P1  : 8.78697e-03 ± 6.44877e-04
  ADC_P2  : -6.59464e-06 ± 3.26436e-06
  CSA_Chi2/NDF : 1.58151e-04 / 2
  CSA_P0  : 5.93962e-02 ± 8.38800e-03
  CSA_P1  : 1.03242e-02 ± 6.31975e-04
  CSA_P2  : -5.77962e-05 ± 9.62424e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [34, 50, 51, 80]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [32, 45, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2495', '1.800', '0.1402', '1.799', '0.0941', '7.000', '0.7071', 1, 1, 1, 1, 1728316606.0003436]
VI_after__Init : ['1.201', '0.2495', '1.800', '0.1402', '1.801', '0.0892', '7.000', '0.7074', 1, 1, 1, 1, 1728316614.0437105]
VI_at__the_End : ['1.201', '0.4759', '1.800', '0.1395', '1.799', '0.1184', '7.000', '0.7079', 1, 1, 1, 1, 1728316676.6090267]