TEST_NAME : Wafer
TEST_DATE : 24_10_07-18_01_41
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-006-021-11 | FUSED_ID : 6359364768413802843
  IC_TEMP :  -57.69 | VDDM : 1108.11 | AUX_INT :   -8.35 | CsaBias :   88.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.31076e-03 / 2
  ADC_P0  : -8.35351e-03 ± 2.45757e-02
  ADC_P1  : 8.09387e-03 ± 5.90450e-04
  ADC_P2  : -4.92565e-06 ± 2.82059e-06
  CSA_Chi2/NDF : 1.37750e-04 / 2
  CSA_P0  : 5.79531e-02 ± 7.82831e-03
  CSA_P1  : 9.98919e-03 ± 5.89807e-04
  CSA_P2  : -4.79605e-05 ± 8.98206e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [68, 83]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [98, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4452', '1.800', '0.1596', '1.799', '0.0929', '7.000', '0.7069', 1, 1, 1, 1, 1728316900.672927]
VI_after__Init : ['1.202', '0.4455', '1.800', '0.1600', '1.800', '0.0884', '7.000', '0.7070', 1, 1, 1, 1, 1728316908.8022316]
VI_at__the_End : ['1.202', '0.4938', '1.800', '0.1371', '1.808', '0.1154', '7.000', '0.7074', 1, 1, 1, 1, 1728316971.8684886]