TEST_NAME : Wafer
TEST_DATE : 24_10_07-18_03_19
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-006-022-11 | FUSED_ID : 6359364768413802859
  IC_TEMP :  -69.36 | VDDM : 1120.75 | AUX_INT :  -10.76 | CsaBias :   69.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.84749e-03 / 2
  ADC_P0  : -1.07556e-02 ± 2.90996e-02
  ADC_P1  : 8.95015e-03 ± 7.36850e-04
  ADC_P2  : -7.58650e-06 ± 3.70803e-06
  CSA_Chi2/NDF : 1.55120e-04 / 2
  CSA_P0  : 6.11961e-02 ± 8.30724e-03
  CSA_P1  : 9.93436e-03 ± 6.25890e-04
  CSA_P2  : -5.12173e-05 ± 9.53157e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [101, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2110', '1.800', '0.1723', '1.800', '0.0913', '7.000', '0.7074', 1, 1, 1, 1, 1728316999.5094283]
VI_after__Init : ['1.202', '0.2110', '1.800', '0.1724', '1.800', '0.0861', '7.000', '0.7070', 1, 1, 1, 1, 1728317007.7077749]
VI_at__the_End : ['1.202', '0.4796', '1.800', '0.1398', '1.799', '0.1181', '7.000', '0.7075', 1, 1, 1, 1, 1728317071.2828808]