TEST_NAME : Wafer
TEST_DATE : 24_10_07-18_04_58
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-006-023-11 | FUSED_ID : 6359364768413802875
  IC_TEMP :  -72.20 | VDDM : 1121.91 | AUX_INT :   -9.11 | CsaBias :   62.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17910e-03 / 2
  ADC_P0  : -9.11246e-03 ± 2.31544e-02
  ADC_P1  : 8.97301e-03 ± 5.83995e-04
  ADC_P2  : -8.08875e-06 ± 2.91270e-06
  CSA_Chi2/NDF : 1.56749e-04 / 2
  CSA_P0  : 5.42378e-02 ± 8.35075e-03
  CSA_P1  : 9.79287e-03 ± 6.29169e-04
  CSA_P2  : -5.04906e-05 ± 9.58149e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [2, 4, 70, 79]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1399', '1.800', '0.1438', '1.799', '0.0926', '7.000', '0.7068', 1, 1, 1, 1, 1728317097.7079232]
VI_after__Init : ['1.201', '0.1399', '1.800', '0.1438', '1.801', '0.0872', '7.000', '0.7072', 1, 1, 1, 1, 1728317106.4632082]
VI_at__the_End : ['1.201', '0.4643', '1.800', '0.1332', '1.803', '0.1207', '7.000', '0.7080', 1, 1, 1, 1, 1728317170.0414097]