TEST_NAME : Wafer
TEST_DATE : 24_10_07-18_06_36
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-006-024-11 | FUSED_ID : 6359364768413802891
  IC_TEMP :  -58.90 | VDDM : 1115.66 | AUX_INT :   -8.08 | CsaBias :   75.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.12214e-03 / 2
  ADC_P0  : -8.08048e-03 ± 2.26565e-02
  ADC_P1  : 8.38873e-03 ± 5.50649e-04
  ADC_P2  : -6.26993e-06 ± 2.64579e-06
  CSA_Chi2/NDF : 1.35556e-04 / 2
  CSA_P0  : 5.93640e-02 ± 7.76571e-03
  CSA_P1  : 9.81865e-03 ± 5.85090e-04
  CSA_P2  : -4.63240e-05 ± 8.91023e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [21]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [38, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3585', '1.800', '0.1597', '1.800', '0.0848', '7.000', '0.7071', 1, 1, 1, 1, 1728317196.4493709]
VI_after__Init : ['1.201', '0.3589', '1.800', '0.1597', '1.800', '0.0796', '7.000', '0.7072', 1, 1, 1, 1, 1728317204.551755]
VI_at__the_End : ['1.201', '0.4892', '1.800', '0.1375', '1.802', '0.1133', '7.000', '0.7079', 1, 1, 1, 1, 1728317267.3617978]