TEST_NAME : Wafer
TEST_DATE : 24_10_07-18_08_15
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-006-025-11 | FUSED_ID : 6359364768413802907
  IC_TEMP :  -65.42 | VDDM : 1111.80 | AUX_INT :  -11.74 | CsaBias :   57.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.61306e-03 / 2
  ADC_P0  : -1.17359e-02 ± 3.47414e-02
  ADC_P1  : 8.72885e-03 ± 8.66744e-04
  ADC_P2  : -6.76085e-06 ± 4.30686e-06
  CSA_Chi2/NDF : 1.67299e-04 / 2
  CSA_P0  : 5.67391e-02 ± 8.62718e-03
  CSA_P1  : 9.94346e-03 ± 6.49996e-04
  CSA_P2  : -5.10797e-05 ± 9.89866e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [101]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3261', '1.800', '0.1523', '1.800', '0.0957', '7.000', '0.7072', 1, 1, 1, 1, 1728317295.1636982]
VI_after__Init : ['1.202', '0.3264', '1.800', '0.1521', '1.801', '0.0906', '7.000', '0.7074', 1, 1, 1, 1, 1728317303.2801867]
VI_at__the_End : ['1.202', '0.4759', '1.800', '0.1360', '1.800', '0.1185', '7.000', '0.7080', 1, 1, 1, 1, 1728317366.545311]