TEST_NAME : Wafer
TEST_DATE : 24_10_07-18_49_18
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-007-003-01 | FUSED_ID : 6359364768413806641
  IC_TEMP :  -76.33 | VDDM : 1119.44 | AUX_INT :   -9.27 | CsaBias :   63.68
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30470e-03 / 2
  ADC_P0  : -9.26862e-03 ± 2.44118e-02
  ADC_P1  : 9.18212e-03 ± 6.37101e-04
  ADC_P2  : -7.99921e-06 ± 3.29615e-06
  CSA_Chi2/NDF : 1.76142e-04 / 2
  CSA_P0  : 5.73198e-02 ± 8.85226e-03
  CSA_P1  : 1.01427e-02 ± 6.66954e-04
  CSA_P2  : -5.70761e-05 ± 1.01569e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [38]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [86]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1361', '1.800', '0.1212', '1.799', '0.0916', '7.000', '0.7077', 1, 1, 1, 1, 1728319758.357989]
VI_after__Init : ['1.202', '0.1361', '1.800', '0.1212', '1.801', '0.0861', '7.000', '0.7080', 1, 1, 1, 1, 1728319766.4013495]
VI_at__the_End : ['1.202', '0.4602', '1.800', '0.1386', '1.804', '0.1215', '7.000', '0.7084', 1, 1, 1, 1, 1728319831.0844367]