TEST_NAME : Wafer
TEST_DATE : 24_10_07-18_44_22
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-007-006-01 | FUSED_ID : 6359364768413806689
  IC_TEMP :  -74.48 | VDDM : 1123.63 | AUX_INT :  -69.99 | CsaBias :   20.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.97930e-03 / 2
  ADC_P0  : -6.99879e-02 ± 3.39523e-02
  ADC_P1  : 1.01103e-02 ± 8.75597e-04
  ADC_P2  : -1.09574e-05 ± 4.44848e-06
  CSA_Chi2/NDF : 2.16710e-04 / 2
  CSA_P0  : 5.82082e-02 ± 9.81888e-03
  CSA_P1  : 1.04504e-02 ± 7.39782e-04
  CSA_P2  : -6.10300e-05 ± 1.12660e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [28]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [46]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2519', '1.800', '0.1345', '1.800', '0.0896', '7.000', '0.7076', 1, 1, 1, 1, 1728319462.346721]
VI_after__Init : ['1.202', '0.2519', '1.800', '0.1345', '1.800', '0.0844', '7.000', '0.7078', 1, 1, 1, 1, 1728319470.4391112]
VI_at__the_End : ['1.202', '0.4697', '1.800', '0.1412', '1.803', '0.1208', '7.000', '0.7086', 1, 1, 1, 1, 1728319536.3440583]