TEST_NAME : Wafer
TEST_DATE : 24_10_07-18_42_44
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-007-007-01 | FUSED_ID : 6359364768413806705
  IC_TEMP :  -66.83 | VDDM : 1112.70 | AUX_INT :   -7.91 | CsaBias :   68.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.61442e-03 / 2
  ADC_P0  : -7.90953e-03 ± 2.72294e-02
  ADC_P1  : 8.50313e-03 ± 6.67849e-04
  ADC_P2  : -6.59241e-06 ± 3.23558e-06
  CSA_Chi2/NDF : 1.28958e-04 / 2
  CSA_P0  : 5.67443e-02 ± 7.57436e-03
  CSA_P1  : 9.91662e-03 ± 5.70673e-04
  CSA_P2  : -5.28219e-05 ± 8.69068e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2038', '1.800', '0.1350', '1.799', '0.0891', '7.000', '0.7088', 1, 1, 1, 1, 1728319363.9361918]
VI_after__Init : ['1.202', '0.2038', '1.800', '0.1350', '1.800', '0.0824', '7.000', '0.7079', 1, 1, 1, 1, 1728319371.976671]
VI_at__the_End : ['1.202', '0.4680', '1.800', '0.1370', '1.799', '0.1178', '7.000', '0.7085', 1, 1, 1, 1, 1728319435.6857293]