TEST_NAME : Wafer
TEST_DATE : 24_10_07-18_41_05
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-007-008-01 | FUSED_ID : 6359364768413806721
  IC_TEMP :  -56.89 | VDDM : 1118.34 | AUX_INT :   -6.63 | CsaBias :   74.75
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35481e-03 / 2
  ADC_P0  : -6.62842e-03 ± 2.50057e-02
  ADC_P1  : 8.18704e-03 ± 6.14385e-04
  ADC_P2  : -4.88026e-06 ± 2.99110e-06
  CSA_Chi2/NDF : 1.46085e-04 / 2
  CSA_P0  : 5.64788e-02 ± 8.06167e-03
  CSA_P1  : 9.65208e-03 ± 6.07389e-04
  CSA_P2  : -4.76730e-05 ± 9.24981e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [53, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2699', '1.800', '0.1495', '1.800', '0.0913', '7.000', '0.7086', 1, 1, 1, 1, 1728319265.293749]
VI_after__Init : ['1.202', '0.2700', '1.800', '0.1495', '1.800', '0.0840', '7.000', '0.7077', 1, 1, 1, 1, 1728319273.4332266]
VI_at__the_End : ['1.202', '0.4741', '1.800', '0.1356', '1.802', '0.1159', '7.000', '0.7086', 1, 1, 1, 1, 1728319335.494402]