TEST_NAME : Wafer
TEST_DATE : 24_10_07-18_37_48
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-007-010-01 | FUSED_ID : 6359364768413806753
  IC_TEMP :  -67.62 | VDDM : 1127.03 | AUX_INT :   -9.03 | CsaBias :   73.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.61353e-03 / 2
  ADC_P0  : -9.03253e-03 ± 2.72972e-02
  ADC_P1  : 8.31068e-03 ± 6.71621e-04
  ADC_P2  : -5.21236e-06 ± 3.28843e-06
  CSA_Chi2/NDF : 1.55834e-04 / 2
  CSA_P0  : 5.82636e-02 ± 8.32633e-03
  CSA_P1  : 1.01050e-02 ± 6.27329e-04
  CSA_P2  : -5.31866e-05 ± 9.55348e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [4]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [12, 46, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2472', '1.800', '0.1692', '1.799', '0.0950', '7.000', '0.7078', 1, 1, 1, 1, 1728319068.0569367]
VI_after__Init : ['1.202', '0.2474', '1.800', '0.1693', '1.799', '0.0893', '7.000', '0.7079', 1, 1, 1, 1, 1728319076.3233123]
VI_at__the_End : ['1.202', '0.4787', '1.800', '0.1380', '1.804', '0.1169', '7.000', '0.7085', 1, 1, 1, 1, 1728319137.1025865]