TEST_NAME : Wafer
TEST_DATE : 24_10_07-18_32_53
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-007-013-01 | FUSED_ID : 6359364768413806801
  IC_TEMP :  -70.87 | VDDM : 1121.99 | AUX_INT :   -8.73 | CsaBias :   74.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.60717e-03 / 2
  ADC_P0  : -8.72682e-03 ± 2.71463e-02
  ADC_P1  : 8.38424e-03 ± 6.50972e-04
  ADC_P2  : -6.49616e-06 ± 3.09444e-06
  CSA_Chi2/NDF : 1.31608e-04 / 2
  CSA_P0  : 5.95230e-02 ± 7.65178e-03
  CSA_P1  : 9.55298e-03 ± 5.76507e-04
  CSA_P2  : -4.84096e-05 ± 8.77952e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [23, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1899', '1.800', '0.1568', '1.799', '0.0934', '7.000', '0.7085', 1, 1, 1, 1, 1728318772.9214897]
VI_after__Init : ['1.202', '0.1900', '1.800', '0.1568', '1.800', '0.0865', '7.000', '0.7078', 1, 1, 1, 1, 1728318780.9099836]
VI_at__the_End : ['1.201', '0.4652', '1.800', '0.1343', '1.803', '0.1190', '7.000', '0.7083', 1, 1, 1, 1, 1728318846.1219895]