TEST_NAME : Wafer
TEST_DATE : 24_10_07-18_27_58
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-007-016-06 | FUSED_ID : 6359364768413806854
  IC_TEMP :  -66.67 | VDDM : 1123.51 | AUX_INT :   -6.36 | CsaBias :   61.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.43085e-04 / 2
  ADC_P0  : -6.36117e-03 ± 2.07384e-02
  ADC_P1  : 8.50741e-03 ± 5.08363e-04
  ADC_P2  : -6.78676e-06 ± 2.45550e-06
  CSA_Chi2/NDF : 1.16561e-04 / 2
  CSA_P0  : 5.86925e-02 ± 7.20111e-03
  CSA_P1  : 9.77577e-03 ± 5.42552e-04
  CSA_P2  : -5.01537e-05 ± 8.26242e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [96]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3831', '1.800', '0.1270', '1.799', '0.0957', '7.000', '0.7079', 1, 1, 1, 1, 1728318477.7783163]
VI_after__Init : ['1.202', '0.3835', '1.800', '0.1272', '1.801', '0.0902', '7.000', '0.7078', 1, 1, 1, 1, 1728318485.843738]
VI_at__the_End : ['1.201', '0.4712', '1.800', '0.1365', '1.799', '0.1177', '7.000', '0.7083', 1, 1, 1, 1, 1728318548.3508573]