TEST_NAME : Wafer
TEST_DATE : 24_10_07-18_26_19
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-007-017-06 | FUSED_ID : 6359364768413806870
  IC_TEMP :  -62.60 | VDDM : 1124.20 | AUX_INT :   -9.44 | CsaBias :   66.60
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.38716e-03 / 2
  ADC_P0  : -9.43701e-03 ± 2.51980e-02
  ADC_P1  : 8.50779e-03 ± 6.13158e-04
  ADC_P2  : -6.62426e-06 ± 2.96220e-06
  CSA_Chi2/NDF : 1.42948e-04 / 2
  CSA_P0  : 6.03580e-02 ± 7.97465e-03
  CSA_P1  : 1.01301e-02 ± 6.00832e-04
  CSA_P2  : -5.32743e-05 ± 9.14996e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [68, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4742', '1.800', '0.1398', '1.799', '0.0984', '7.000', '0.7077', 1, 1, 1, 1, 1728318379.1679292]
VI_after__Init : ['1.202', '0.4750', '1.800', '0.1398', '1.800', '0.0929', '7.000', '0.7076', 1, 1, 1, 1, 1728318388.0132997]
VI_at__the_End : ['1.202', '0.4837', '1.800', '0.1384', '1.804', '0.1151', '7.000', '0.7083', 1, 1, 1, 1, 1728318453.4592452]