TEST_NAME : Wafer
TEST_DATE : 24_10_07-18_24_41
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-007-018-06 | FUSED_ID : 6359364768413806886
  IC_TEMP :  -70.61 | VDDM : 1122.83 | AUX_INT :   -7.93 | CsaBias :   54.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.06856e-03 / 2
  ADC_P0  : -7.93068e-03 ± 2.20455e-02
  ADC_P1  : 8.94977e-03 ± 5.55612e-04
  ADC_P2  : -8.25230e-06 ± 2.75325e-06
  CSA_Chi2/NDF : 1.56837e-04 / 2
  CSA_P0  : 5.87453e-02 ± 8.35307e-03
  CSA_P1  : 9.71606e-03 ± 6.29344e-04
  CSA_P2  : -4.89448e-05 ± 9.58416e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [14, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [78, 81, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1252', '1.800', '0.1453', '1.800', '0.0849', '7.000', '0.7075', 1, 1, 1, 1, 1728318281.5774183]
VI_after__Init : ['1.202', '0.1252', '1.800', '0.1454', '1.801', '0.0798', '7.000', '0.7076', 1, 1, 1, 1, 1728318289.7376783]
VI_at__the_End : ['1.202', '0.4746', '1.800', '0.1378', '1.803', '0.1172', '7.000', '0.7083', 1, 1, 1, 1, 1728318350.115145]